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Walid Amir
Garduate Research Assistant
2019 - Present
Ph.D. Student (Master's & Ph.D Integrated Course)
Education:
-B.Sc. in Electrical and Electronic Engineering,
Ahsanullah University of Science and Technology, Bangladesh.
Research Topic:
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AlGaN/GaN Heterostructure Reliability
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HEMT Trap Characterization
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1/f Low-Frequency Noise
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MOSFET Characterization
Contact:
E-mail: walid37@ulsan.ac.kr / walid.amir.rakin@gmail.com
Surajit Chakraborty
Garduate Research Assistant
2020 - Present
Ph.D. Student
Education:
-M.Sc. in Applied Physics, Electronics & Communication Engineering
Dhaka University, Bangladesh
-B.Sc. in Applied Physics, Electronics & Communication Engineering
Dhaka University, Bangladesh
Research Topic:
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HEMT Reliability and Characterization.
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HEMT Device Modeling.
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Noise Modeling and MMIC design.
Contact:
E-mail: surajit5103@ulsan.ac.kr / surajit.apece@gmail.com
Shin Ki Yong
Garduate Research Assistant
2021 - Present
Ms. Student
Education:
-B.S. in Electrical and Electronic Engineering
University of Ulsan(UOU), Ulsan, Korea
Research Topic:
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Device Fabrication
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InGaAs HEMT Reliability
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HEMT Trap Characterization
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1/f Low-Frequency Noise
Contact:
E-mail: rldyd3140@ulsan.ac.kr
Shin Ju Won
Garduate Research Assistant
2021 - Present
Ms. Student
Education:
-B.S. in Physics & Electrical and Electronic Engineering
University of Ulsan(UOU), Ulsan, Korea
Research Topic:
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Device Fabrication
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GaN HEMT Reliability
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HEMT Trap Characterization
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1/f Low-Frequency Noise
Contact:
E-mail: swinwins@ulsan.ac.kr
Geum Dong Geol
Undergarduate Research Assistant
2021 - Present
Undergraduate Intern
Education:
-B.S. in Electrical and Electronic Engineering,
University of Ulsan(UOU), Ulsan, Korea (2017 ~ Present)
Research Topic:
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Device Fabrication
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GaN / InGaAs HEMT Reliability
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HEMT Trap Characterization
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High Frequency Noise Modeling
Contact:
E-mail: keum1731@ulsan.ac.kr
Kim Hyo Joung
Undergarduate Research Assistant
2022 - Present
Undergraduate Intern
Education:
-B.S. in Electrical and Electronic Engineering,
University of Ulsan(UOU), Ulsan, Korea (2020 ~ Present)
Research Topic:
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Device Fabrication
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GaN / InP HEMT Reliability
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HEMT Trap Characterization
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1/f Low-Frequency Noise
Contact:
E-mail: himisslonely@naver.com
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